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T2: SIC Reliability Testing for Automotive and Traction Applications - VPPC 2021

T2: SIC Reliability Testing for Automotive and Traction Applications

Instructor: Francesco Iannuzzo, Aalborg University, Denmark

Abstract: The tutorial introduces the modern principles of testing for reliability of modern power electronic components. After a short introduction about CORPE – the center of Reliable Power Electronics at Aalborg University, expectations from power electronics industries will be presented. Some reliability theory fundamentals will be given, along with practical details about common testing protocols. Wear/life testing types will be then presented and classified, each with its specific aim. The last part will be about the original test approach at Aalborg University used for Silicon Carbide MOSFETs, which are becoming very appealing for the automotive market. Some prospects about failure analysis will conclude the tutorial.

Bio: Francesco Iannuzzo received the M.Sc. degree in Electronic Engineering and the Ph.D. degree in Electronic and Information Engineering from the University of Naples, Italy, in 1997 and 2002, respectively. He is primarily specialized in power device modelling.

He is currently a professor of reliable power electronics at the Aalborg University, Denmark, where he is also part of CORPE, the Center of Reliable Power Electronics. His research interests are in the field of reliability of power devices, including mission-profile based life estimation, condition monitoring, failure modelling and testing up to MW-scale modules under extreme conditions. He is author or co-author of more than 230 publications on journals and international conferences, three book chapters and four patents. Besides publication activity, over the past years he has been contributing 17 technical seminars about reliability at first conferences as ISPSD, EPE, ECCE, PCIM and APEC.

Prof. Iannuzzo is a senior member of the IEEE (Industry Application Society, Reliability Society, Power Electronic Society, and Industrial Electronic Society). He currently serves as Associate Editor for the IEEE Journal of Emerging and Selected Topics in Power Electronics, Transactions on Industry Applications, the EPE Journal, and Elsevier Microelectronics Reliability. He is vice-chair of the IEEE IAS Power Electronic Devices and Components Committee. In 2018 he was the general chair of the 29th ESREF, the first European conference on the reliability of electronics, and has recently been appointed general chair for the EPE 2023 conference in Aalborg.